Article 17215

Title of the article



Litvinov Aleksandr Nikolaevich, Doctor of engineering science, professor, sub-department of theoretical and applied mechanics and graphics, Penza State University (40 Krasnaya street, Penza, Russia),
Khadi Odey Shaker, Postgraduate student, Penza State University (40 Krasnaya street, Penza, Russia),
Yurkov Nikolay Kondrat'evich, Doctor of engineering sciences, professor, head of sub-department of radio equipment design and production, Penza State University (40 Krasnaya street, Penza, Russia),

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Background. Modeling of the stress-strain state (SSS) of the basic structural ele-ments of electronic systems (RES) in conditions actual operation is an urgent prob-lem, the solution of which allows at the early design stages to identify the most loaded elements of RES and to make design technological decisions to optimize the design. The aim of this work is to increase the reliability and to provide the required performance characteristics of RES products by a technological method.
Materials and methods. The authors considered a mathematical model of a real board of RES with hinged heat producing elements under the influence of the heat caused by the operating mode. Mathematical modeling of the thermal field and board’s SSS was based on the finite element method (FEM), implemented in the ANSYS software package.
Results. The authors carried out mathematical modeling and analysis of thermal fields and SSS of boards under the action of external thermal impacts. The research-ers established the board’s most loaded areas, which are vulnerable to formation of defects of mechanical origin, including latent ones, in conditions of RES exploita-tion. The authors proposed design-technological methods to reduce stress and im-prove thermo mechanical reliability of the design.
Conclusions. The proposed model allows to investigate SSS of boards taking into account with the real location and installation conditions of attached components. Through mathematical modeling the authors established the most loaded areas on a board and its components under operational thermal impacts.

Key words

board electronic systems, thermal effect, temperature field, stress-strain state.

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Дата создания: 02.10.2015 15:20
Дата обновления: 06.10.2015 09:53